2 results
Characterization of Small Cu Grains Using the Conical Dark-Field Technique in the Transmission Electron Microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1100-1101
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Determination of dielectric permittivity from EELSpectra in semiconductor structures
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1252-1253
- Print publication:
- August 2007
-
- Article
- Export citation